X-ray investigation of crystal structures / Laue method with digital X-ray image sensor(XRIS)

Item No. P2541606 | Type: Experiments

45 Minutes
45 Minutes
grades 10-13 , University
Students
heavy
EUR 43,950.80
Content 1 piece
EUR 52,301.45 Incl. VAT

Principle

Laue diagrams are produced when monocrystals are irradiated with polychromatic X-rays. This method is primarily used for the determination of crystal symmetries and the orientation of crystals. When a LiF monocrystal is irradiated with polychromatic X-rays, a characteristic diffraction pattern results. This pattern is photographed with the digital X-ray sensor XRIS.

Tasks

  1. The Laue diffraction of an LiF monocrystal is to be recorded with the aid of the digital X-ray sensor.
  2. The Miller indices of the corresponding crystal surfaces are to be assigned to the Laue reflections.


Learning objectives

  • Crystal lattices
  • Crystal systems
  • Crystal classes
  • Bravais lattice
  • Reciprocal lattice
  • Miller indices
  • Structure amplitude
  • Atomic form factor
  • The Bragg equation

Software included. Computer not provided.

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(en) Versuchsbeschreibung
p2541606_en .pdf
Filesize 1.87 Mb
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p2541606_es .pdf
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(ru) Versuchsbeschreibung
p2541606_ru .pdf
Filesize 2.18 Mb
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