Software package to extend the operating modes of the compact atomic force microscope (09700-99) with Advanced Spectroscopy, Lithography (scratching, oxidation), Manipulation (oxidation, cutting and moving/pushing of nanoparticles)) and User expandability (Scripting via visual basic, LabView, etc.). Incl. Set of samples and cantilevers.

Equipment and Technical Data

• Software package / Activation key for:
• Current-distance spectroscopy
• Advanced Spectroscopy (e.g. spectroscopy curves; max. 1024 points, Stop by end value, fwd. and bwd. pause)
• Lithography (pattern writing (scratching, oxidation, …) with vector and bitmap graphics)
• Manipulation (Oxidation, cutting of nanoparticles, moving/pushing of nanoparticles)
• User expandability (scripting) AFM can be controlled by e.g. Visual Basic, Lab View, etc.
• Set of 2 Samples:
• Sample for Scratching - CD-ROM Piece
• Sample for Manipulation - Glass beads (incl. Silica Colloid)
• Set of 8 Cantilever:
• 4 x 190TapAl G (Dynamic Force Mode) for Spectroscopy and Manipulation
• 4 x CONTR (Static Force Mode) for Lithography and Manipualtion
• Instruction for preparation and imaging of glass beads
• For an instruction in Lithography, Manipulation and Scripting please refer to the AFM manual (print-out as part of the device and linked in the measure nano software package (help panel)) and the additional manual linked in the measure nano software package (help panel).