Spectroscopy and manipulation upgrade,for compact atomic force microscope

Item No. 09702-00 | Type: Equipment & Accessories

Teachers/Professors , Students
Delivery time: available
EUR 4,588.50
Content 1 piece

Function and Applications

Software package to extend the operating modes of the compact atomic force microscope (09700-99) with Advanced Spectroscopy, Lithography (scratching, oxidation), Manipulation (oxidation, cutting and moving/pushing of nanoparticles)) and User expandability (Scripting via visual basic, LabView, etc.). Incl. Set of samples and cantilevers.

Equipment and Technical Data

  • Software package / Activation key for:
  • Current-distance spectroscopy
  • Advanced Spectroscopy (e.g. spectroscopy curves; max. 1024 points, Stop by end value, fwd. and bwd. pause)
  • Lithography (pattern writing (scratching, oxidation, …) with vector and bitmap graphics)
  • Manipulation (Oxidation, cutting of nanoparticles, moving/pushing of nanoparticles)
  • User expandability (scripting) AFM can be controlled by e.g. Visual Basic, Lab View, etc.
  • Set of 2 Samples:
  • Sample for Scratching - CD-ROM Piece
  • Sample for Manipulation - Glass beads (incl. Silica Colloid)
  • Set of 8 Cantilever:
  • 4 x 190TapAl G (Dynamic Force Mode) for Spectroscopy and Manipulation
  • 4 x CONTR (Static Force Mode) for Lithography and Manipualtion
  • Instruction for preparation and imaging of glass beads
  • For an instruction in Lithography, Manipulation and Scripting please refer to the AFM manual (print-out as part of the device and linked in the measure nano software package (help panel)) and the additional manual linked in the measure nano software package (help panel).

(en) Content of delivery
0970200a_e .pdf
Filesize 0.13 Mb
(en) Handling Glass Beads
0970200b_e .pdf
Filesize 0.28 Mb
(de) Kompakt Rasterkraft-Mikroskop, 2 Seiten
00277_01_afm_deutsch .pdf
Filesize 3.49 Mb
(en) Product flyer
00277_02_afm_englisch .pdf
Filesize 0.51 Mb